Tech Xplore on MSN

AI rebuilds 3D structures from 2D microscope images with speed and precision

An AI algorithm converts 2D electron microscope images into accurate 3D structures, cutting analysis time and cost to ...
Semiconductor Engineering

Review of Automatic EM Image Algorithms for Semiconductor Defect Inspection (KU Leuven, Imec)

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...